演讲嘉宾
: Dr. Tao, Guoqiao (
陶国桥
)
，
Reliability Principal
（
质量首席工程师
），
GDC-Shanghai, Philips Lighting Sources & Electronics
地点：延长校区，平板显示楼会议室
时间：
2014
年
9
月
18
日星期四，上午
10:00-11:00
主办：上海平板显示工程技术研究中心、新型显示技术及应用集成教育部重点实验室、新型显示知识服务团队
Dr. Tao, Guoqiao
，
obtained BSc in semiconductor Physics from Nanjing University in 1982, MSc In EE from Delft University of Technology in 1990, and PhD from Delft University of Technology in 2004. He j
oint Philips as a reliability principal in 2011, focusing on SSL reliability. Prior to that, we worked on embedded Non-Volatile Memory technology development and reliability for 15 years at NXP semiconductors in the Netherlands.
He has been member of TPC of IEEE-IRPS (2005-2007). He was the general chair of IEEE-IRW (2009).
He has been a TPSC member of IEEE-IPFA since 20
09
, and chairing the sub-committee of “novel devices, LED reliability and failure mechanisms.
报告摘要
:
This talk will start with an introduction to product reliability, and explaining the special failure modes associated with solid-state lighting that causes catastrophic failures and lumen decay. Further, a picture of current reliability landscape will be sketched. And finally, the research frontiers on understanding the failure mechanisms, performing accelerated life-testing, lowering product failure rates, building reliability models, and design for reliability are addressed.
